BM-XJL-20

נאָך אינפֿאָרמאַציע

קאָד

BM-XJL-20

MOQ

1פּקס

פּראָדוקט דעטאַילס:

XJL-20DIC Differential Interference Contrast Metallurgical microscopes are suitable for differential-interference -contrast-observation in the surface of the un-transparent object. It equipped an excellent UIS optical system and the notion of modularization function design, provide excellent optical performance and the update of the system. The product has a beautiful configuration, easy operation, clear image, so it is the perfect research instrument for detection and analysis of precision engineering, etc.

Specification:

 

Specification
אויג פּיעסע
Widefield WF10X(Φ22mm)
Objective
Infinity plan achromatic objectives with long working distance(no cover glass)
LMPlan5X/0.12DIC Work distance£º18.2 mm
LMPlan10X/0.25DIC Work distance£º20.2 mm
LMPlan20X/0.35DIC Work distance£º6.0 mm
PL L40X/0.60 Work distance£º3.98 mm
DIC push-pull group
Suitable for LMPlan5X¡¢10X¡¢20X DIC objective
Eyepiece tube
Inclination 45°and interpupillary distance:53~75mm
פאָקוס סיסטעם
Coaxial coarse/fine focus with tension adjustable and up stop, minimum division of fine focusing:2.0μm.
Nosepiece
Quintuple(backward ball bearing inner locating)
Stage
Mechanical stage,size£º242mmX200mm£¬moving range: 30mmX30mm.
Rotundity and rotatable stage size£º§¶130mm minimal clear aperture is less than §¶20mm
Illumination system
12V50W halogen lamp£¬brightness adjustable
Integrated field diaphragm, aperture diaphragm, and system polarizer
Equipped with frosted glass and yellow, green, and blue filters

באַקומען אַ שנעל ציטירן

מיר וועלן ענטפערן ין 24 שעה, ביטע באַצאָלן ופמערקזאַמקייַט צו די בליצפּאָסט מיט די סאַפיקס "@barride-optics.com".

איר קענט אויך גיין צו די יו קאָנטאַקט בלאַט און פּלאָמבירן אויס אַ מער דיטיילד פאָרעם.

אָנפרעג: BM-XJL-20

מיר וועלן ענטפערן ין 24 שעה, ביטע באַצאָלן ופמערקזאַמקייַט צו די בליצפּאָסט מיט די סאַפיקס "@barride-optics.com".