BM-XJL-20

Additional information

Code

BM-XJL-20

MOQ

1pcs

Product Details:

XJL-20DIC Differential Interference Contrast Metallurgical microscopes are suitable for differential-interference -contrast-observation in the surface of the un-transparent object. It equipped an excellent UIS optical system and the notion of modularization function design, provide excellent optical performance and the update of the system. The product has a beautiful configuration, easy operation, clear image, so it is the perfect research instrument for detection and analysis of precision engineering, etc.

Specification:

 

Specification
Eyepiece
Widefield WF10X(Φ22mm)
Objective
Infinity plan achromatic objectives with long working distance(no cover glass)
LMPlan5X/0.12DIC Work distance£º18.2 mm
LMPlan10X/0.25DIC Work distance£º20.2 mm
LMPlan20X/0.35DIC Work distance£º6.0 mm
PL L40X/0.60  Work distance£º3.98 mm
DIC push-pull group
 Suitable for LMPlan5X¡¢10X¡¢20X DIC objective
Eyepiece tube
Inclination 45°and interpupillary distance:53~75mm
Focus system
Coaxial coarse/fine focus with tension adjustable and up stop, minimum division of fine focusing:2.0μm.
Nosepiece
Quintuple(backward ball bearing inner locating)
Stage
Mechanical stage,size£º242mmX200mm£¬moving range: 30mmX30mm.
Rotundity and rotatable stage size£º§¶130mm minimal clear aperture is less than §¶20mm
Illumination system
12V50W halogen lamp£¬brightness adjustable
Integrated field diaphragm, aperture diaphragm, and system polarizer
Equipped with frosted glass and yellow, green, and blue filters

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