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BM-158J

BM-158J

Metallurgical Microscope

Additional information

Code

BM-158J
MOQ

1pcs
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Product Details:

Introduction:
BM-158J Metallurgical microscope is developed and aimed at the semiconductor industry, wafer manufacturing, electronic information industry, metallurgical industry, Used as an advanced Metallurgical microscope, the user can experience its super performance when using it. It can be widely used to identify and analyze Semiconductor, FPD, Circuit encapsulation, a circuit substrate, Material, Casting/Metal/Ceramic parts, Precision molds. This instrument adopts both reflecting and transmitted illumination, Bright£¦Dark field, DIC, and Polarizing observation can proceed under reflecting illumination, and the Bright field observation is done under transmitted light. High quality and reliable optical system bring a much clearer and sharper image. The design meets the ergonomics needs and makes you feel comfortable and relaxed in doing your job.
 
      Specification
Viewing Head
  Compensation Free Trinocular Head, Inclined 30° 50mm-75mm 
Eyepiece
  WF10×/25mm
  WF10×/20mm,crosshair with reticule 0.1mm
Objective
  Long working distance bright dark field Infinity.Plan Objectives:
  5×/0.1B.D/W.D.29.4mm 10×/0.25B.D/W.D.16mm 
  20×/0.40B.D/W.D.10.6mm 40×/0.60B.D/W.D.5.4mm 
Nosepiece
  With DIC Jack Quadruple Nosepiece
Stage
  Double layer mechanical stage
  Stage Size: 189mm×160mm
  Moving Range:80mm×50mm
Filter
  Flashboard type Filters (green,blue,neutral)
Condenser
  N.A.1.25 Abbe Condenser with iris diaphragm and filter
Focusing
  Coaxial coarse fine focusing adjustment with rack and pinion mechanism.Fine
  focusing scale value 0.002mm
Light Source
  Transmission Illumination: Halogen Bulb 12V/50W, AC85V-230V, Brightness Adjustable
  Epi-illumination: With aperture iris diaphragm and field iris diaphragm, halogen
  Bulb 12V/50W, AC85V-230V, Brightness Adjustable
Polarizing Device
  Analyzer 360°rotatable, both Polarizer, and Analyzer can be moved out of the light path
Checking Tool
  0.01mm Micrometer
Optional Accessory
  Two-dimensional measure software
  Professional metallurgical image analysis software
  Epi-illumination:Halogen Bulb 12V/100W,AC85V-230V, Brightness Adjustable
  Long working distance bright £¦ dark field Infinite Plan objectives: 50
  ×/0.55B.D/W.D.5.1mm 80×/0.75B.D/W.D.4mm 100×/0.80B.D/W.D.3mm
  micrometer eyepiece
  1.3Mega 2.0 Mega¡¢3.0 Mega,5.0 Mega pixels CMOS Digital camera eyepieces
  Photography attachmentand CCD Adapter 0.5× 0.57× 0.75×
  DIC10×20×40×100×
  Planishing tool
  CCD Camera,colour 1/3″High resolution 520 TV lines
Characteristics and description
 
1.     Adopt UIS High-resolution, long working distance, and infinity light path
        correcting system objective imaging technology
2.     Extending the multiplexing technology of objective, compatible infinity
        the objective with all the observation methods, including bright£¦dark field
        observation, polarization, and DIC also provide with high clear and sharp
        image in each observation method.
3.     Aspherical surface Kohler illumination, increasing the viewing brightness.
4.     WF10×£¨Φ25£©Super wide viewing field Eyepiece, long working distance
        the metallurgical objective with bright and dark field
5.     The Nosepiece can be equipped with detachable DIC differential interference

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