Produktuaren xehetasunak:
XJL-20DIC Differential Interference Contrast Metallurgical microscopes are suitable for differential-interference -contrast-observation in the surface of the un-transparent object. It equipped an excellent UIS optical system and the notion of modularization function design, provide excellent optical performance and the update of the system. The product has a beautiful configuration, easy operation, clear image, so it is the perfect research instrument for detection and analysis of precision engineering, etab.
Zehaztapena:
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Zehaztapena
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Okularra
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Widefield WF10X(Φ22mm)
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Helburu
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Infinity plan achromatic objectives with long working distance(no cover glass)
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LMPlan5X/0.12DIC Work distance£º18.2 mm
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LMPlan10X/0.25DIC Work distance£º20.2 mm
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LMPlan20X/0.35DIC Work distance£º6.0 mm
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PL L40X/0.60 Work distance£º3.98 mm
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DIC push-pull group
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Suitable for LMPlan5X¡¢10X¡¢20X DIC objective
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Eyepiece tube
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Inclination 45°and interpupillary distance:53~75mm
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Foku sistema
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Coaxial coarse/fine focus with tension adjustable and up stop, minimum division of fine focusing:2.0μm.
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Sudurra
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Quintuple(backward ball bearing inner locating)
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Etapa
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Mechanical stage,size£º242mmX200mm£¬moving range: 30mmX30mm.
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Rotundity and rotatable stage size£º§¶130mm minimal clear aperture is less than §¶20mm
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Illumination system
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12V50W halogen lamp£¬brightness adjustable
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Integrated field diaphragm, aperture diaphragm, and system polarizer
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Equipped with frosted glass and yellow, berdea, and blue filters
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Barruan erantzungo dugu 24 orduak, mesedez, arreta jarri atzizkia duen mezu elektronikoari “@barride-optics.com”.
Era berean, joan zaitezke Harremanetarako Orria eta bete formulario zehatzagoa.
Barruan erantzungo dugu 24 orduak, mesedez, arreta jarri atzizkia duen mezu elektronikoari “@barride-optics.com”.
