BM-403J

Lisainformatsioon

Kood

BM-403J

MOQ

1tk

Toote üksikasjad:

Introduction:
This series microscope is widely used in observation & analysis of the metallurgical organizations in the Mechanical industry, Research of the Geological & Mineral department, and viewing & measuring crystals, integrate circuits, microelectronics, etc in the Electronic industry. It is the first choice of Factories, Academy, Scientific research organization contrast image. Novel figures and superior craftsmanship keep abreast of the tidal current much more.
Humanized configuration design and simple operation, Let you release from the pressure of heavy work.
Spetsifikatsioon
Mudel
BM-403J
BM-403JT
BM-403JA
BM-403JAT
Vaatepea
Compensation Free Binocular Head. Inclined
at 45 ° ( 50mm -75 mm )
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Compensation Free Trinocular Head.
Kallutatud juures 45 ° ( 50mm -75 mm )
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Okulaar
WF10 × /20mm
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WF10 ×/ 22mm
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WF10 × /20mm with reticule 0.1mm
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Ninaotsik
Neljakordne ninaots
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Quintuple nosepiece
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Eesmärk
195 metallurgical
objectives
4 × /0.1W.D .25mm
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10 ×/ 0.25W.D .11mm
20 × /0.4W.D .9mm
40 × /0.6W.D. 3.8mm
Infinity metallurgical
objectives
4 × /0.1W.D .25mm
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10 ×/ 0.25W.D .12mm
20 × /0.4W.D .10mm
40 × /0.6W.D. 7.1mm
50 × /0.75W.D. 1.9mm 80 (S)× /0.9W.D. 0.9mm
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Lava
Double layers mechanical stage
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Stage size: 242mm × 172mm
Central stage: Φ110mm
Moving range: 75mm × 50mm
Keskendumine
Koaksiaalne jäme & fine focusing adjustment with
rack and pinion mechanism Fine focusing scale
Value 0.002mm
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Valgustus
Epi-Kohler illumination. With aperture
iris diaphragm and field iris diaphragm.
12V/30W.AC85V-230V Adjustable brightness
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Filter
Blue, roheline, yellow
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Polarizing outfit
Analyzer rotatable 360 ° ,polarizer & Analyzer
can be slid slide in/out of the optical path
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Checking tool
0.01mm micrometer
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Valikuline tarvik
1.3 2.0 3.0 5.0 Megapixels CMOS electronic eyepiece
Photography attachment

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Päring: BM-403J

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