BM-158J

Name: BM-158J
Brand: Barride Optics
Author: Barride Opitcs-First

Дадатковая інфармацыя

Код	BM-158J
MOQ	1шт

Падрабязная інфармацыя аб прадукце:

Introduction:

BM-158J Metallurgical microscope is developed and aimed at the semiconductor industry, wafer manufacturing, electronic information industry, metallurgical industry, Used as an advanced Metallurgical microscope, the user can experience its super performance when using it. It can be widely used to identify and analyze Semiconductor, FPD, Circuit encapsulation, a circuit substrate, Матэрыял, Casting/Metal/Ceramic parts, Precision molds. This instrument adopts both reflecting and transmitted illumination, Bright£¦Dark field, DIC, and Polarizing observation can proceed under reflecting illumination, and the Bright field observation is done under transmitted light. High quality and reliable optical system bring a much clearer and sharper image. The design meets the ergonomics needs and makes you feel comfortable and relaxed in doing your job.

Спецыфікацыя
Прагляд галавы	Compensation Free Trinocular Head, Inclined 30° 50mm-75mm
Акуляр	WF10×/25mm
Акуляр	WF10×/20mm,crosshair with reticule 0.1mm
Мэта	Long working distance bright dark field Infinity.Plan Objectives: 5×/0.1B.D/W.D.29.4mm 10×/0.25B.D/W.D.16mm 20×/0.40B.D/W.D.10.6mm 40×/0.60B.D/W.D.5.4mm
Насадка для носа	With DIC Jack Quadruple Nosepiece
Этап	Double layer mechanical stage
	Stage Size: 189mm×160mm
	Дыяпазон перамяшчэння:80mm×50mm
Filter	Flashboard type Filters (green,blue,neutral)
Кандэнсатар	N.A.1.25 Abbe Condenser with iris diaphragm and filter
Засяроджванне	Coaxial coarse fine focusing adjustment with rack and pinion mechanism.Fine значэнне шкалы факусіроўкі 0,002 мм
Крыніца святла	Transmission Illumination: Halogen Bulb 12V/50W, AC85V-230V, Brightness Adjustable
Крыніца святла	Epi-illumination: With aperture iris diaphragm and field iris diaphragm, halogen Bulb 12V/50W, AC85V-230V, Brightness Adjustable
Polarizing Device	Analyzer 360°rotatable, both Polarizer, and Analyzer can be moved out of the light path
Checking Tool	0.01mm Micrometer
Optional Accessory	Two-dimensional measure software
	Professional metallurgical image analysis software
	Epi-illumination:Halogen Bulb 12V/100W,AC85V-230V, Brightness Adjustable
	Long working distance bright £¦ dark field Infinite Plan objectives: 50 ×/0.55B.D/W.D.5.1mm 80×/0.75B.D/W.D.4mm 100×/0.80B.D/W.D.3mm
	micrometer eyepiece
	1.3Mega 2.0 Mega¡¢3.0 Mega,5.0 Mega pixels CMOS Digital camera eyepieces
	Photography attachmentand CCD Adapter 0.5× 0.57× 0.75×
	DIC10×20×40×100×
	Planishing tool
	CCD Camera,colour 1/3″High resolution 520 TV lines

Characteristics and description

1. Adopt UIS High-resolution, long working distance, and infinity light path

correcting system objective imaging technology

2. Extending the multiplexing technology of objective, compatible infinity

the objective with all the observation methods, including bright£¦dark field

observation, polarization, and DIC also provide with high clear and sharp

image in each observation method.

3. Aspherical surface Kohler illumination, increasing the viewing brightness.

the metallurgical objective with bright and dark field

5. The Nosepiece can be equipped with detachable DIC differential interference

BM-158J

Дадатковая інфармацыя

прадукты

Кампанія

Падтрымка

Атрымайце хуткую прапанову

Запыт: BM-158J

BM-158J

Дадатковая інфармацыя

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Запыт: BM-158J