BM-403J

Bykomende inligting

Kode

BM-403J

MOQ

1stuks

Produk besonderhede:

Inleiding:
This series microscope is widely used in observation & analysis of the metallurgical organizations in the Mechanical industry, Research of the Geological & Mineral department, and viewing & measuring crystals, integrate circuits, microelectronics, etc in the Electronic industry. It is the first choice of Factories, Academy, Scientific research organization contrast image. Novel figures and superior craftsmanship keep abreast of the tidal current much more.
Humanized configuration design and simple operation, Let you release from the pressure of heavy work.
Spesifikasie
Model
BM-403J
BM-403JT
BM-403JA
BM-403JAT
Viewing head
Compensation Free Binocular Head. Inclined
at 45 ° ( 50mm -75mm )
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Vergoedingsvrye driehoekige kop.
Inclined at 45 ° ( 50mm -75mm )
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Oogstuk
WF10 × /20mm
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WF10 ×/ 22mm
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WF10 × /20mm with reticule 0.1mm
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Neusstuk
Quadruple nosepiece
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Quintuple nosepiece
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Doel
195 metallurgical
objectives
4 × /0.1W.D .25mm
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10 ×/ 0.25W.D .11mm
20 × /0.4W.D .9mm
40 × /0.6W.D. 3.8mm
Infinity metallurgical
objectives
4 × /0.1W.D .25mm
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10 ×/ 0.25W.D .12mm
20 × /0.4W.D .10mm
40 × /0.6W.D. 7.1mm
50 × /0.75W.D. 1.9mm 80 (S)× /0.9W.D. 0.9mm
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Verhoog
Double layers mechanical stage
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Stage size: 242mm × 172mm
Central stage: Φ110mm
Moving range: 75mm × 50mm
Fokus
Coaxial coarse & fine focusing adjustment with
rack and pinion mechanism Fine focusing scale
Value 0.002mm
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Verligting
Epi-Kohler illumination. With aperture
iris diaphragm and field iris diaphragm.
12V/30W.AC85V-230V Adjustable brightness
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Filter
Blou, groen, yellow
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Polarizing outfit
Analyzer rotatable 360 ° ,polarizer & Analyzer
can be slid slide in/out of the optical path
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Checking tool
0.01mm micrometer
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Opsionele bykomstigheid
1.3 2.0 3.0 5.0 Megapixels CMOS electronic eyepiece
Photography attachment

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Ondersoek: BM-403J

Ons sal binne reageer 24 ure, let asseblief op die e-pos met die agtervoegsel "@barride-optics.com".